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Particle Scanner - List of Manufacturers, Suppliers, Companies and Products

Particle Scanner Product List

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Wafer Surface Particle Scanner YPI-MX

Standard device for non-patterned transparent and semi-transparent wafer surface particles!

In addition to silicon wafers, double-polished transparent wafers and single-side polished translucent wafers (back matte wafers) can also be measured. You can choose between automatic transport specifications and manual transport specifications. There is an option for microscope observation that allows for review after measurement.

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Wafer Surface Particle Scanner YPI-MX-DC

Next-generation power semiconductor wafer particle inspection equipment for SiC/GaN.

Non-patterned SiC bulk wafer 0.1μm detection. Detection of micro-scratches. Ideal for confirming the cleaning of SiC and GaN wafers. Automatic and manual transport options are available. Microscopic observation function allows for review after measurement.

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Particle scanner for component cleanliness inspection "Micro Quick"

Simple scanning system! Membrane analysis and report generation possible in 2.5 minutes.

"Micro Quick" is a particle scanner for inspecting the cleanliness of components that can measure particle area, width, length, and number for particles larger than 25μm. When a membrane filter that has collected contaminants from automotive and precision machinery parts is set in the scanner, particle analysis is completed in just 2.5 minutes, and the results report particle diameter, number, and classification based on ISO16232 and VDA19. For small, precision components, it is crucial to analyze the size, number, shape, and classification of particles. This product allows for an easy start to foreign matter inspection of components standardized by ISO16232 and VDA19. 【Features】 ■ Particle counting method (size and number) according to international standard ISO16232 (automotive: inspection of component cleanliness) ■ Automatic report generation for easy results reporting ■ Automatic scanning and analysis ensure consistent results regardless of who operates it ■ Micro Quick operation is also documented in VDA19 (German automotive industry standard) ■ Adopted by many automotive companies and component manufacturers producing fluid circuits *For more details, please refer to the PDF materials or feel free to contact us.

  • Other measurement, recording and measuring instruments

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Wafer Surface Particle Scanner YPI-MN

A compact and space-saving tabletop particle inspection device ideal for device development and wafer cleaning checks!

It is a non-pattern wafer and substrate surface particle inspection device. It is a manual transport tabletop inspection device that does not take up much space. It is easy to install in labs or next to equipment. It can measure not only silicon but also glass materials.

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